SEM and CL (NBE/Visible) images of first axial cross-section (a) and those of second basal cross-section (b), both of which are probed by 3.0 keV e-beam. Original nanorod volume is indicated by ...

Cross-section observation of a specimen using SEM can produce detailed information vital for research and development as well as for failure analysis. Generally, surface observation alone is incapable ...

For the preparation of simple SEM cross sections of IC devices, there are essentially two approaches that are possible among the established practices: encapsulated cross sections and un-encapsulated ...

When preparing cross sections, the standard procedure using the FIB-SEM technique is the use of high currents to quickly remove material, then lower the FIB current for an improved beam profile ...

Figure 1. shows cross-sectional SEM images and EDS maps of the CS precursors and lithiated samples. Figures 1b and 1c show a clear manganese and cobalt-rich shell and a nickel-rich core in the ...

Cross-section SEM images were taken at low magnification was taken (Left) which shows that larger Ni-rich precursor particles and the smaller Mn-rich precursor particles are well segregated in the ...

The wafer is cleaved for SEM cross section analysis and a Hitachi S-7840 CD SEM is used to determine the best dose and focus conditions on Si wafer. Fig. 2: Wafer layout for the FEM. A thirteen column ...

Cross sections are used to communicate results among researchers with common interests, Morfín says. The previous cross section serves, then, as a way to compare data obtained from labs that use ...

Cross-sectional SEM image of a perovskite/silicon tandem solar cell without the deposition of LiF and Ag . Image: Zhejiang University, nature communications, CC BY-NC-ND 4.0.