Serial data streams continue to increase in speed while error specifications tighten, which makes testing for jitter tolerance and bit-error rate (BER) ever more ...

Selecting the right oscilloscope need not be as complex as it is critical for successful chip development or board inter-operation With all the varieties and speeds of serial data communication ...

A system architecture designed from the ground up for high-efficiency multisite test will minimize test costs for semiconductor manufacturers. Hand-held consumer products, such as cellular phones and ...

This is the second article of a three-part series discussing the likely impacts of next-generation consumer wireless semiconductor devices on instrumentation performance requirements. The first ...

In Part I of this article, I briefly mentioned the generic USB driver in the context of getting a USB device to communicate through it easily, with no custom kernel programming. Unfortunately, I ...