This example compares the use of three-parameter and two-parameter Weibull Q-Q plots for the failure times in months for 48 integrated circuits. The times are assumed to follow a Weibull distribution.

Output 4.2.3 provides two EDF goodness-of-fit tests for the Weibull distribution: the Anderson-Darling and the Cramer-von Mises tests. (See Table 4.17 for a complete list of the EDF tests available in ...

A. Clifford Cohen, Multi-Censored Sampling in the Three Parameter Weibull Distribution, Technometrics, Vol. 17, No. 3 (Aug., 1975), pp. 347-351 ...

Point estimators of parameters of the first asymptotic distribution of smallest (extreme) values, or, the extreme-value distribution, are surveyed and compared. Those investigated are ...