Cross-section observation of a specimen using SEM can produce detailed information vital for research and development as well as for failure analysis. Generally, surface observation alone is incapable ...

When preparing cross sections, the standard procedure using the FIB-SEM technique is the use of high currents to quickly remove material, then lower the FIB current for an improved beam profile ...

For the preparation of simple SEM cross sections of IC devices, there are essentially two approaches that are possible among the established practices: encapsulated cross sections and un-encapsulated ...

Cross-section SEM was performed using an FEI Nova NanoSEM, with a working-distance of 4.4 mm, accelerating potential of 10 kV and 1.3 mA operating current. Additional information.

Figure 1. shows cross-sectional SEM images and EDS maps of the CS precursors and lithiated samples. Figures 1b and 1c show a clear manganese and cobalt-rich shell and a nickel-rich core in the ...

Cross-section SEM images were taken at low magnification was taken (Left) which shows that larger Ni-rich precursor particles and the smaller Mn-rich precursor particles are well segregated in the ...

The database contains evaluated cross sections for 48 reactions induced by light charged-particles with incident energies up to several tens of MeV (maximum 100 MeV). Production cross sections for the ...

Cross sections are used to communicate results among researchers with common interests, Morfín says. The previous cross section serves, then, as a way to compare data obtained from labs that use ...